Pin hole detection (Scan-i)

Pin hole detection (Scan-i)

Scan-i is an advanced scanning system that detects pinholes or pores located anywhere in the formed blister.
  • Can adjust sensitivity to detect upto 20 micron-sized holes at high speed and resolution
  • Supports unlimited width and length
  • Can be provided for base/lidding foil
  • GMP Compliant
  • Compatible with any machine type
  • Includes multiple zones to avoid rejection of good blisters

Benefits

  • 100% pinhole inspection of lidding foil

Applications

  • It can detect malformations in foils, laminated paper or other non-transparent materials.
  • Can detect both angular or sidewall defects
  • Can be customized according to the blister packaging machines
  • Does data mining analysis